HI-TEK INTERNATIONAL INC.
LCD/FPD Test System
HFT-8500
Corresponding to test requirement for various kinds of FPDs such as LCDs with FT/STN, Stripe/Delta type for XGA/SXGA/UXGA and even PDP
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- Realizing very high throughput employing MINATO's originally designed Multi-Process DSP and Dual Frame Memory Functions for high speed Image Processing and Test Result Judgement
- Rich variety of high performance detection capabilities not only for various kind of Mura, Dot Defect, Line defect but also Cross-talk, Flicker, Image Retention, View Angle Failure with powerful Binning function applying various kind of flexible test patterns. For PDP Testing, Driving Voltage Auto- Adjustment Function can be incorporated as an option
- Capable of executiong flexible Image Data and Test Result Data Collections in combination with various application softwares currently available in the market under Multi-Windows OS environment.
- Furthermore all Test Data and X-Y Address of defective Pixel Locations can be generated by numeric value so that these data can be utilized for various applications such as Process Control, Quality Assurance and also transferred to the Repair Sytem